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Proceedings of
2nd International Conference on Advances in Applied Science and Environmental Technology ASET 2015
"EFFECT OF PRESSURE ON ELECTRICAL RESISTANCE OF SNSEREX (X=0.1, 0.2, 0.3, 0.4) (DVT) GROWN CRYSTALS"
G. K. SOLANKI
PRATIK PATANIYA
DOI
10.15224/978-1-63248-075-0-40
Pages
13 - 15
Authors
2
ISBN
978-1-63248-075-0
Abstract: “Rhenium dopped Tin monoselenide crystals have been grown by Direct Vapour Transport (DVT) technique using two zone horizontal furnace by trial and error method. The results of electrical resistance measurements under pressure on single crystals of SnSeRex (x = 0.1, 0.2, 0.3, 0.4) (DVT) are reported. Measurements up to 4GPa are carried out using Bridgman anvil set up. There is no clear indication of any phase transition till the highest pressure is reached in these measurements.”
Keywords: Crystal growth, Bridgman anvil, high pressure