Abstract: Analysis electrical properties change of a semiconductor radiation detector, based on Cadmium-Telluride material has been carried out. The detector was exposed to temperature 100 °C for time period of 24 hours. Heat stress caused an increase of leakage currents by two orders. New defect energy levels caused difference in detector current transit, typical for the polarization effect. The noise spectral density of the detector after thermal stressing increases with the power of 6.81, which is significantly higher value than 2.70, measured before thermal stressing.

• Publication Date: 05-May-2013
• DOI: 10.15224/978-981-07-6261-2-58
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Abstract: This paper presents a mathematical model as a new approach to object mapping, the system is proscribed to indoor and applied to approach a landmark. The contribution of this paper is to propose a new mathematical model for object mapping, the landmark is captured at varying distant points, the Scale invariant Feature Transform (SIFT) to extract object options, at the side of their uncertainty, from camera sensors. The (SIFT) features are invariant to image scaling, translation, and rotation, and partially invariant to illumination changes and affine or 3D projection, which is suitable for our application. As image options do not seem to be noise-free, the error analysis of the landmark positions and a preprocessing to obtained information which is incorporated into a model, using curve fitting techniques. Predictions createdby our model square measure well and correlate with experimental knowledge. This has eliminated correspondence Problem also known as a data association problem.

• Publication Date: 05-May-2013
• DOI: 10.15224/978-981-07-6261-2-59
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