A TEST STRUCTURE FOR IN-SITU DETERMINATION OF RESIDUAL STRESS
Published In: INTERNATIONAL CONFERENCE ON ADVANCES IN ELECTRONICS, ELECTRICAL AND COMPUTER SCIENCE ENGINEERING
Author(s): AKSHDEEP SHARMA , DEEPAK BANSAL
Abstract: This work presents a lancet type residual stress measurement test structure which comprises of a pair of bent beams along with cantilevers as driving bars for the rotational pointer structure. The residual stress causes the bent beams to deflect each other, thereby magnifying the pointer deflection. The pointer deflection direction indicates the type of stress (compressive or tensile), with the displacement being independent of Young`s modulus and film thickness. Finite element modeling also used to analyze the structure and is compared with experimental results of electroplated Au structures.
- Publication Date: 09-Jul-2012
- DOI: 10.15224/978-981-07-2950-9-9733
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COMPARATIVE ANALYSIS OF GSM BASED MOBILE COMMUNICATION UNDER RADIO PROPAGATION ENVIRONMENT
Published In: INTERNATIONAL CONFERENCE ON ADVANCES IN ELECTRONICS, ELECTRICAL AND COMPUTER SCIENCE ENGINEERING
Author(s): POOJA PRAJESH , R.K.SINGH
Abstract: In cellular system, the knowledge of environment characterstics is useful for predicting the path loss. The path loss models which are generally used for achieving the signal attenuation or path loss. This paper deals with comparative parametric analysis of different types of path loss model in macro cell with real time measurement obtained from Bharat Sanchar Nigam Limited (BSNL), a GSM based wireless network in Bhuj, Gujarat(India) has been implemented.
- Publication Date: 09-Jul-2012
- DOI: 10.15224/978-981-07-2950-9-9740
- Views: 0
- Downloads: 0